All Issue

2024 Vol.34, Issue 11

Review

27 November 2024. pp. 529-536
Abstract
References
1

Statista, Artificial intelligence (AI) market size worldwide from 2020 to 2030 (in billion U.S. dollars). Retrieved November 5, 2024 from https://www.statista.com/forecasts/1474143/global-ai-market-size

2

S. McCann, V. Smet, V. Sundaram, R. R. Tummala and S. K. Sitaraman, IEEE Trans. Compon., Packag., Manuf. Technol., 7, 178 (2017).

10.1109/TCPMT.2016.2641164
3

Yole Group, Glass Core substrates: the new race for advanced packaging giants. Retrieved November 11, 2024 from https://www.yolegroup.com/strategy-insights/glass-core-substrates-the-new-race-for-advanced-packaging-giants/

4

Y. Chen, Y. Xie, L. Song, F. Chen and T. Tang, Engineering, 6, 264 (2020).

10.1016/j.eng.2020.01.007
5

K. J. Lee, Adv. Comput., 122, 217 (2021).

10.1016/bs.adcom.2020.11.001
6

T. Tan and G. Cao, in Proceedings of the 20th International Conference on Information Processing in Sensor Networks (New York, NY, May 2021), p. 283-298.

7

T. Tan and G. Cao, IEEE Trans. Mobile Comput., 23, 10706 (2024).

10.1109/TMC.2024.3379501
8

X. Lin, X. Zhou, R. Liu and X. Gao, in Proceedings of the IEEE 3rd International Conference on Computer Communication and Artificial Intelligence (Taiyuan, May 2023), p. 45-49.

10.1109/CCAI57533.2023.10201248
9

A. Yazdanbakhsh, J. Park, H. Sharma, P. Lotfi-Kamran and H. Esmaeilzadeh, in Proceedings of the 48th Annual IEEE/ACM International Symposium on Microarchitecture (Waikiki, HI, December 2015), p. 482-493.

10

R. Singh and S. S. Gill, Internet Things Cyber-Phys. Syst., 3, 71 (2023).

10.1016/j.iotcps.2023.02.004
11

M. Merenda, C. Porcaro and D. Iero, Sensors, 20, 2533 (2020).

10.3390/s2009253332365645PMC7273223
12

M. C. Silva, J. C. F. da Silva, S. Delabrida, A. G. C. Bianchi, S. P. Ribeiro, J. S. Silva and R. A. R. Oliveira, Sens., 21, 5082 (2021).

10.3390/s2115508234372319PMC8347733
13

M. K. Lee, W. B. Lee, S. B. Choi, J.-W. Jo, J. K. Kim, S. K. Park and Y. H. Kim, Adv. Mater., 29, 1700951 (2017).

10.1002/adma.201770288
14

D. Marković, A. Mizrahi, D. Querlioz and J. Grollier, Nat. Rev. Phys., 2, 499 (2020).

10.1038/s42254-020-0208-2
15

J. C. Lee, J. H. Kim, K. W. Kim, Y. J. Ku, D. S. Kim, C. S. Jeong, T. S. Yun, H. J. Kim, H. S. Cho, S. M. Oh, H. S. Lee, K. H. Kwon, D. B. Lee, Y. J. Choi, J. J. Lee, H. G. Kim, J. H. Chun, J. H. Oh and S. H. Lee, in Proceedings of the International SoC Design Conference (Jeju, October 2016), p. 181-182.

10.1109/ISOCC.2016.7799847
16

A. Sebastian, M. Le Gallo, R. Khaddam-Sljameh and E. Eleftheriou, Nat. Nanotechnol., 15, 529 (2020).

10.1038/s41565-020-0655-z32231270
17

D. Lelmini and H. S. Philip Wong, Nat. Electron., 1, 333 (2018).

10.1038/s41928-018-0092-2
18

F. F. C. Duval, M. Detalle, X. Sun, E. Beyne, C. R. Neve and D. Velenis, in Proceedings of the 5th Electronics System-integration Technology Conference (Helsinki, September 2014), p. 1-6.

10.1109/ESTC.2014.6962789
19

K. Okamoto, S. Kohara and H. Mori, in Proceedings of the ASME 2017 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (San Francisco, CA, October 2017), V001T02A018.

20

J. C. Lee, J. H. Kim, K. W. Kim, Y. J. Ku, D. S. Kim, C. S. Jeong, T. S. Yun, H. J. Kim, H. S. Cho, S. M. Oh, H. S. Lee, K. H. Kwon, D. B. Lee, Y. J. Choi, J. J. Lee, H. G. Kim, J. H. Chun, J. H. Oh and S. H. Lee, in Proceedings of the IEEE 38th International Conference on Computer Design (Hartford, CT, October 2020), p. 80-87.

21

E. J. Cheng and Y.-L. Shen, Microelectron. Reliab., 52, 534 (2012).

10.1016/j.microrel.2011.11.001
22

I. H. Jeong, S. H. Kee and J. P. Jung, J. Microelectron. Electron. Packag., 21, 23 (2014).

10.6117/kmeps.2014.21.2.023
23

T. Tang, Y. Yuan, Y. Yalikun, Y. Hosokawa, M. Li and Y. Tanaka, Sens. Actuators, B, 339, 129859 (2021).

10.1016/j.snb.2021.129859
24

H. Ebadi-Dehaghani and M. Nazempour, Thermal conductivity of nanoparticles filled polymers, p.519, in Smart Nanoparticles Technology (ed. A. Hashim), InTechOpen, London, UK (2012).

10.5772/33842
25

S. Erfantalab, G. Parish and A. Keating, Int. J. Heat Mass Transfer, 184, 122346 (2022).

10.1016/j.ijheatmasstransfer.2021.122346
26

M. L. Baesso, J. Shen and R. D. Snook, Chem. Phys. Lett., 197, 255 (1992).

10.1016/0009-2614(92)85764-2
27

R. S. Khmyrov, S. N. Grigoriev, A. A. Okunkova and A. V. Gusarov, Phys. Procedia, 56, 345 (2014).

10.1016/j.phpro.2014.08.117
28

A. K. Varshneya, Fundamentals of Inorganic Glasses, p.4, Academic Press Inc., New York, USA (1994).

10.1016/B978-0-08-057150-8.50025-2
29

A. Ben-Yakar, A. Harkin, J. Ashmore, R. L. Byer and H. A. Stone, J. Phys. D: Appl. Phys., 40, 1447 (2007).

10.1088/0022-3727/40/5/021
30

J. K. Carson and M. Alsowailem, Polym. Polym. Compos., 25, 447 (2017).

10.1177/096739111702500603
31

Y. Shoji, R. Ishige, T. Higashihara, J. Morikawa, T. Hashimoto, A. Takahara and M. Ueda, Macromolecules, 46, 747 (2013).

10.1021/ma302486s
32

A. Chen and R. H. Y. Lo, Semiconductor Packaging: Materials Interaction and Reliability, 1st ed., p. 61-153. CRC Press, Boca Raton, FL, USA (2012).

33

H. J. Kim, Ceramist, 22, 429 (2019).

10.31613/ceramist.2019.22.4.01
34

C. L. Rathmann, G. H. Mann and M. E. Nordberg, Appl. Opt., 7, 819 (1968).

10.1364/AO.7.00081920068691
35

A. Bhattacharya, D. Putrevu, D. K. Pandey and A. Misra, Prog. Electromagn. Res. C, 112, 179 (2021).

10.2528/PIERC21021004
36

F. Oikonomopoulou, F. A. Veer, T. Bristogianni, C. Groot, R. Nijsse and K. Karron, In Insights and Innovations in Structural Engineering, 1st ed., p.1668, CRC Press, Boca Raton, FL, USA (2016).

10.1201/9781315641645-275
37

K. Fenske and D. Misra, Blood, 58, 1 (2000).

8

D. Ehrt and R. Keding, Phys. Chem. Glasses: Eur. J. Glass Sci. Technol., Part B, 50, 165 (2009).

39

A. Prasad, K. Prajwal, D. N. Sahu, M. A. Hasan, S. K. Sahoo, A. Dey, A. Rajendra and A. Ambirajan. Int. J. Thermophys., 41, 100 (2020).

10.1007/s10765-020-02677-w
40

H. Cao, C. Shen, C. Wang, H. Xu and J. Zhu, Materials, 12, 1099 (2019).

10.3390/ma1207109930987072PMC6480374
41

R. Jensen, J. Cummings and H. Vora, IEEE Trans. Compon., Hybrids, Manuf. Technol., 7, 384 (1984).

10.1109/TCHMT.1984.1136378
42

A. A. El-Kheshen and M. F. Zawrah, Ceram. Int., 29, 251 (2003).

10.1016/S0272-8842(02)00112-8
43

S. Ristić, A. Prijić and Z. Prijić, Serbian J. Electr. Eng., 1, 237 (2024).

10.2298/SJEE0402237R
44

T. Qi, P. Irwin and Y. Cao, IEEJ Trans. Fundam. Mater., 126, 1153 (2006).

10.1541/ieejfms.126.1153
45

E. A. D. Santos and G. P. Rehder, Mat. Res., 20, 81 (2017).

10.1590/1980-5373-mr-2017-0439
46

H. J. Kim and J. P. Jung, J. Microelectron. Packag. Soc., 30, 11 (2023).

10.6117/kmeps.2023.30.3.011
47

J. H. Lau, J. Electron. Packag., 146, 010801 (2024).

10.1115/1.4062529
48

J. H. Lau, J. Microelectron. Electron. Packag., 20, 43 (2023).

10.4071/001c.81977
49

S. Khushu and W. Gomes, in Proceedings of the IEEE Hot Chips 31 Symposium (Cupertino, CA, August 2019), p. 1-20.

50

Advanced Micro Devices, Inc., 4th Gen AMD EPYC™ Processor Architecture, 4th ed. Retrieved November 6, 2024 from https://www.amd.com/en/products/processors/server/epyc/4th-generation-architecture.html

51

J. Qi, Z. Wang, J. Xu, Z. Lin, X. Li, W. Chu and Y. Cheng, Opt. Express, 26, 29669 (2018).

10.1364/OE.26.02966930469928
52

Y. Chen, J. Zhang, L. Gao, S. Zou, K. Liang, Z. Liu, Z. Fang, H. Chen and Q. Ye, Microelectron. Eng., 257, 111735 (2022).

10.1016/j.mee.2022.111735
53

K. Hu, S. Li, Z. Fan, H. Yan, X. Liang, Y. Cai, Q. Zhu and Y. Zhang, Mat. Des., 202, 109579 (2021).

10.1016/j.matdes.2021.109579
54

B. C. Seok and J. P. Jung, J. Weld. Joining, 42, 165 (2024).

10.5781/JWJ.2024.42.2.2
55

S. Y. Chang, Y. H. Huang and L. C. Tsao, Active solders and active soldering, p. 1-16, in Fillers-Synthesis, Characterization and Industrial Application (ed. A. Patnaik), IntechOpen, London, UK (2019).

10.5772/intechopen.82382
56

D. Yonekura, T. Ueki, K. Tokiyasu, S. Kira and T. Wakabayashi, Mat. Des., 65, 907 (2015).

10.1016/j.matdes.2014.10.024
57

H. Li, R. Yi and C. Chen, J. Mater. Res. Technol., 18, 3227 (2022).

10.1016/j.jmrt.2022.03.155
58

M. Töpper, I. Ndip, R. Erxleben, L. Brusberg, N. Nissen, H. Schröder, H. Yamamoto, G. Todt and H. Reichl, in Proceedings of the 60th Electronic Components and Technology Conference (Las Vegas, NV, June 2010), p. 66-73.

10.1109/ECTC.2010.5490887
Information
  • Publisher :Materials Research Society of Korea
  • Publisher(Ko) :한국재료학회
  • Journal Title :Korean Journal of Materials Research
  • Journal Title(Ko) :한국재료학회지
  • Volume : 34
  • No :11
  • Pages :529-536
  • Received Date : 2024-09-26
  • Revised Date : 2024-11-07
  • Accepted Date : 2024-11-08