All Issue

2019 Vol.29, Issue 2
February 2019. pp. 65-72
Abstract
References
1.
H.-C. Shin and M. Liu, Chem. Mater., 16, 5460 (2004).10.1021/cm048887b
2.
J. Cabana, J. Monconduit, D. Larcher and M. R. Palacin, Adv. Mater., 22, E170 (2010).10.1002/adma.20100071720730811
3.
M. Ahmad, J. Zhao, J. Iqbal, W. Miao, L. Xie, R. Mo and J. Zhu, J. Mater. Chem., 21, 7723 (2011).10.1039/c1jm10720h
4.
D. H. Ha, M. A. Islam and R. D. Robinson, Nano Lett., 12, 5122 (2012).10.1021/nl301955922963404
5.
Y. M. Chun and H. C. Shin, Electrochim. Acta, 209, 369 (2016).10.1016/j.electacta.2016.05.089
6.
J. Vetter, P. Nova'k, M.R. Wagner, C. Veit, K.-C. Mőller, J.O. Besenhard, M. Winter, M. Wohlfahrt-Mehrens, C. Vogler and A. Hammouche, J. Power Sources, 147, 269 (2005).10.1016/j.jpowsour.2005.01.006
7.
M. Wachtler, M. Winter and J. O. Besenhard, J. Power Sources, 105, 151 (2002).10.1016/S0378-7753(01)00934-X
8.
H.-C. Shin, J. Dong and M. Liu, Adv. Mater., 15, 1610 (2003).10.1002/adma.200305160
9.
K.-L. Lee, J.-Y. Jung, S.-W. Lee, H.-S. Moon and J.-W. Park, J. Power Sources, 129, 270 (2004).10.1016/j.jpowsour.2003.10.013
10.
R. H. Kim, D. W. Han, D. H. Nam, J. H. Kim and H. S. Kwon, J. Electrochem. Soc., 157, D269 (2010).10.1149/1.3356974
11.
Y. H. Rho, K. Kanamura, M. Fujisaki, J.-I. Hamagami, S.-I. Suda and T. Umegaki, Solid State Ionics, 151, 151 (2002).10.1016/S0167-2738(02)00594-5
12.
H. Duan, J. Gnanaraj, X. Chen, B. Li and J. Liang, J. Power Sources, 185, 512 (2008).10.1016/j.jpowsour.2008.06.078
13.
P. L. Taberna, S. Mitra, P. Poizot, P. Simon and J. M. Tarascon, Nat. Mater., 5, 567 (2006).10.1038/nmat167216783360
14.
M. H. Ryou, Y. M. Lee, Y. Lee, M. Winter and P. Bieker, Adv. Funct. Mater., 25, 834 (2015).10.1002/adfm.201402953
15.
J. L. Ord and D. J. DeSmet, J. Electrochem. Soc., 123, 1876 (1976).10.1149/1.2132715
16.
X. Zhou, G. E. Thompson, H. Habazaki, K. Shimizu, P. Skeldon and G. C. Wood, Thin Solid Films, 293, 327 (1997).10.1016/S0040-6090(96)09117-1
17.
S. Rudenja, J. Pan, I. Odnevall, C. Leygraf, P. Kulu, J. Electrochem. Soc., 146(11), 4082, (1999) 10.1149/1.1392595
18.
J. P. O'sullivan, and G. C. Wood, Proc. R. Soc. Lond. A, 317, 511 (1970).10.1098/rspa.1970.0129
19.
D. Gong, C. A. Grimes, O. K. Varghese, W. Hu, R. S. Singh, Z. Chen and E. C. Dickey, J. Mater. Res., 16, 3331 (2001).10.1557/JMR.2001.0457
20.
J.-W. Lee, S.-J. Park, W.-S. Choi, H.-C. Shin, Electrochim. Acta, 56, 5919 (2011).10.1016/j.electacta.2011.03.144
21.
G. E. Thompson, Thin Solid Films, 297, 192 (1997).10.1016/S0040-6090(96)09440-0
22.
K. Nielsch, J. Choi, K. Schwirn, R. B. Wehrspohn and U. Gosele, Nano Lett., 2, 677 (2002).10.1021/nl025537k
23.
S. H. Park, H. S. Shin, Y. H. Kim, H. M. Park and J. Y. Song, J. Alloys Compd., 580, 152 (2013).10.1016/j.jallcom.2013.05.130
Information
  • Publisher :Materials Research Society of Korea
  • Publisher(Ko) :한국재료학회
  • Journal Title :Korean Journal of Materials Research
  • Journal Title(Ko) :한국재료학회지
  • Volume : 29
  • No :2
  • Pages :65-72
  • Received Date : 2018-11-02
  • Revised Date : 2018-12-10
  • Accepted Date : 2018-11-30