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2016 Vol.26, Issue 12 Preview Page
Comparison of Existing Methods to Identify the Number of Graphene Layers
Rakesh Sadanand Sharbidre12
,
Chang Jun Lee23
,
Seong-Gu Hong2
,
Jae-Kyung Ryu4
,
Taik Nam Kim1
1Department of Material Science Engineering, Paichai University, Daejeon 35345, Republic of Korea
2Division of Industrial Metrology, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea
3School of Mechanical Engineering, Chonnam National University, Gwangju 61186, Republic of Korea
4Department of Dental Technology and Science, ShinHan University
†Corresponding author E-Mail : tnkim@pcu.ac.kr (T. N. Kim, Paichai Univ.)
December 2016. pp. 704-708
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Abstract

The unique characteristics of graphene make it an optimal material for crucial studies; likewise, its potential applications are numerous. Graphene’s characteristics change with the number of total layers, and thus the rapid and accurate estimation of the number of graphene layers is essential. In this work, we review the methods till date used to identify the number of layers but they incorporate certain drawbacks and limitations. To overcome the limitations, a combination of these methods will provide a direct approach to identify the number of layers. Here we correlate the data obtained from Raman spectroscopy, optical microscopy images, and atomic force microscopy to identify the number of graphene layers. Among these methods, correlation of optical microscopy images with Raman spectroscopy data is proposed as a more direct approach to reliably determine the number of graphene layers.

Keywords
graphene
number of graphene layers
optical microscopy
Raman spectroscopy
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Information
  • Publisher :Materials Research Society of Korea
  • Publisher(Ko) :한국재료학회
  • Journal Title :Korean Journal of Materials Research
  • Journal Title(Ko) :한국재료학회지
  • Volume : 26
  • No :12
  • Pages :704-708
  • Received Date : 2016-10-28
  • Revised Date : 2016-10-28
  • Accepted Date : 2016-11-06
  • DOI :https://doi.org/10.3740/MRSK.2016.26.12.704
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