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2020 Vol.30, Issue 1
January 2020. pp. 1-7
Abstract
References
1.
B. G. Lewis and D. C. Paine, Mater. Res. Soc. Bull., 25, 22 (2000). 10.1557/mrs2000.147
2.
M. Yan, M. Lane, C. R. Kannewarf and R. P. H. Changa, Appl. Phys. Lett., 78, 2342 (2001). 10.1063/1.1365410
3.
Powder Diffraction File, Joint Committee for Powder Diffraction Studies (JCPDS) file No. 05-0640.
4.
Z. Zhao, D. L. Morel and C. S. Ferekides, Thin Solid Films, 413, 203 (2002). 10.1016/S0040-6090(02)00344-9
5.
P. K. Gupta, K. Ghosh, R. Patel, S. R. Mishra and P. K. Kahol, Curr. Appl. Phys., 9, 673 (2009). 10.1016/j.cap.2008.06.004
6.
A. A. Dakhel, Adv. OptoElectron., 2013, 6 (2013). 10.1155/2013/804646
7.
A. A. Dakhel, Thin Solid Films, 41, 2405 (2012). 10.1007/s11664-012-2160-0
8.
K. M. A. Hussain, Z. H. Mahmood, I. M. Syed, T. Begum, T. Faruqe1 and J. Parvin, Am. J. Mater. Sci. Application, 2, 91 (2014).
9.
F. V. Wald, Revue de Physique Appliquee, 12, 277 (1977). 10.1051/rphysap:01977001202027700
10.
R. D. Shannon, Acta Crystallogr., Sect. A: Found. Adv., 32, 751 (1976).
11.
S. Sonmezoglu, T. A. Termeli, S. Akın and I. Askeroglu, J. Sol-Gel Sci. Technol., 67, 97 (2013). 10.1007/s10971-013-3054-1
12.
A. A. Dakhel, Sol. Energy, 84, 1433 (2010). 10.1016/j.solener.2010.05.003
13.
F. Jamali-Sheini, R. Yousefi, M. R. Mahmoudian, N. A. Bakr, A. Saaedi and N. M. Hyang, Ceram. Int., 40, 7737 (2014). 10.1016/j.ceramint.2013.12.115
14.
S. Sonmezoglu and E. Akman, Appl. Surf. Sci., 318, 319 (2014). 10.1016/j.apsusc.2014.06.187
15.
T. Minami, Thin Solid Films, 516, 1314 (2008). 10.1016/j.tsf.2007.03.082
16.
T. Ratcheva, M. Nanova, L. Kinova and I. Penev, Thin Solid Films, 202, 243 (1991). 10.1016/0040-6090(91)90095-F
17.
B. Georgieva, I. Podolesheva, G. Spasov and J. Pirov, Sensors (Basel), 14, 8950 (2014). 10.3390/s14050895024854359PMC4063046
18.
J. M. Jaklevic and F. S. Goulding, Energy Dispersion in X-ray Spectrometry, p.50, ed. H. K. Herglotz and L. S.Birks, NY: M. Dekker (1978).
19.
A. A. Dakhel and H. Hamad, Int. J. Thin Films Sci. Technol., 1, 25 (2012).
20.
A. A. Dakhel, Chem. Phys., 130, 398 (2011). 10.1016/j.matchemphys.2011.06.060
21.
A. A. Dakhel, J. Mater. Sci.: Mater. Electron., 29, 3584 (2018). 10.1007/s10854-017-8288-1
22.
L. B. McCusker, R. B. Von Dreele, D. E. Cox, D. Louer and P. Scardi, J. Appl. Cryst., 32, 36 (1999). 10.1107/S0021889898009856
23.
A. Khorsand Zak, W. H. Abd Majid, M. E. Abrishami and R. Yousefi, Solid State Sci., 13, 251 (2011). 10.1016/j.solidstatesciences.2010.11.024
24.
J. Tauc and F. Abelesn ed., Optical Properties of Solids, North Holland (1969).
25.
J. I. Pankove, Optical processes in semiconductors, p. 36, NY: Dover (1975).
26.
Y. Z. Zhang, J. G. Lu, Z. Z. Ye, H. P. He, L. P. Zhu, B. H. Zhao and L. Wang, Appl. Surf. Sci., 254, 1993 (2008). 10.1016/j.apsusc.2007.08.008
27.
Y. Dou, R. G. Egdell, T. Walker, D. S. L. Law and G. Beamson, Surf. Sci., 398, 241 (1998). 10.1016/S0039-6028(98)80028-9
28.
M. Chen, Z. L. Pei, X. Wang, Y. H. Yu, X. H. Liu, C. Sun and L. S. Wen, J. Phys. D: Appl. Phys., 33, 2538 (2000). 10.1088/0022-3727/33/20/304
Information
  • Publisher :Materials Research Society of Korea
  • Publisher(Ko) :한국재료학회
  • Journal Title :Korean Journal of Materials Research
  • Journal Title(Ko) :한국재료학회지
  • Volume : 30
  • No :1
  • Pages :1-7
  • Received Date : 2019-08-29
  • Revised Date : 2019-08-29
  • Accepted Date : 2019-10-02